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Scanning Microscopy for Nanotechnology: Techniques and Applications
by Weilie Zhou
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Amazon.com Product Description (ISBN 0387333258, Hardcover)This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
(retrieved from Amazon Thu, 12 Mar 2015 18:16:33 -0400)
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